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scan chain
A shift register made up of the logic storage elements (standalone bit-storage devices). In test mode, the storage elements are connected in a shift register. During normal operation they carry out their normal system functions. The scan path is used to shift test data into the logic storage elements for controllability and to shift out test response data for observability. (Also called scan path.)
- Part of Speech: noun
- Industry/Domain: Semiconductors
- Category: Digital Signal Processors (DSP)
- Company: Texas Instruments
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- Dedrick
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